Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-12-13
2005-12-13
Ngô, Ngân V. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S408000
Reexamination Certificate
active
06975000
ABSTRACT:
A method of forming a device (and the device so formed) comprising the following steps. A structure having a gate structure formed thereover is provided. Respective low doped drains are formed within the structure at least adjacent to the gate structure. A pocket implant is formed within the structure. The structure adjacent the gate structure is etched to form respective trenches having exposed side walls. Respective first liner structures are formed at least over the exposed side walls of trenches. Respective second liner structures are formed over the first liner structures. Source/drain implants are formed adjacent to, and outboard of, second liner structures to complete formation of device.
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patent: 2003/0030114 (2003-02-01), Kuwazawa
patent: 2005/0035408 (2005-02-01), Wang et al.
Chung-Heng Yang
Lin-June Wu
Yu Chiu-Hung
Ngo Ngan V.
Taiwan Semiconductor Manufacturing Company
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