Method of forming a metal pattern in manufacturing a semiconduct

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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430313, 15665911, 216 41, G03F 720

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056702981

ABSTRACT:
A method a metal pattern on a substrate. The method comprises the steps of forming a metal film on the substrate, forming a porous film on the metal film, forming a photoresist pattern on the porous film, and etching the metal film and the porous film using the photoresist pattern as a mask to thereby form the metal pattern. During the step of forming the photoresist pattern on the porous film, the porous film causes the scattering of light incident on the porous film to thereby cause a mutual interference of the light.

REFERENCES:
patent: 4820611 (1989-04-01), Arnold
patent: 5068207 (1991-11-01), Manocha
patent: 5126289 (1992-06-01), Ziger
patent: 5286608 (1994-02-01), Koh

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