Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1996-10-25
2000-12-05
Elms, Richard
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438656, 438683, 438685, H01L 214763
Patent
active
061566454
ABSTRACT:
A wetting layer is formed on a substrate at a relatively high process temperature (e.g., the temperature of the substrate and/or the temperature within a process chamber in which the wetting layer is formed). A metallization layer that is subsequently formed on the wetting layer adheres to the wetting layer better than the metallization layer would adhere to the wetting layer if the wetting layer was formed at a lower process temperature. The high process temperature causes the density of the wetting layer to be increased, so that, consequently, the wetting layer has a smoother surface to which the metallization layer can adhere.
REFERENCES:
patent: 4600658 (1986-07-01), Anderson et al.
patent: 4786962 (1988-11-01), Koch
patent: 4970176 (1990-11-01), Tracy et al.
patent: 5108570 (1992-04-01), Wang
patent: 5236868 (1993-08-01), Nulman
patent: 5242860 (1993-09-01), Nulman et al.
patent: 5270255 (1993-12-01), Wong
patent: 5288665 (1994-02-01), Nulman
patent: 5312512 (1994-05-01), Allman et al.
patent: 5371042 (1994-12-01), Ong
patent: 5378660 (1995-01-01), Ngan et al.
patent: 5380678 (1995-01-01), Yu et al.
patent: 5393565 (1995-02-01), Suzuki et al.
patent: 5434044 (1995-07-01), Nulman et al.
patent: 5443995 (1995-08-01), Nulman
patent: 5470792 (1995-11-01), Yamada
patent: 5521120 (1996-05-01), Nulman et al.
patent: 5804251 (1998-09-01), Yu et al.
Singer, Pete, "The Interconnect Challenge: Filling Small, High Aspect Ratio Contact Holes," Seniconductor International, Aug. 1994, pp. 57-64.
Zheng Xu et al., Al planarization processes for multilayer metallization of quarter micrometer devices, Thin Solid Films 253 (1994), Elsevier Science S.A., pp. 367-371.
Zheng Xu et al., Planar Multilevel Metallization Technologies for ULSI Devices, SPIE, vol. 2335, pp. 70-79.
Geha Sam G.
Shan Ende
Berry Renee R.
Cypress Semiconductor Corporation
Elms Richard
Kelber Steven B.
LandOfFree
Method of forming a metal layer on a substrate, including format does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming a metal layer on a substrate, including format, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a metal layer on a substrate, including format will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-961267