Method of forming a mesa in a semiconductor device with subseque

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29578, 29580, 29413, 29414, 156644, 156645, 156649, 225 2, 225 965, H01L 2178

Patent

active

043554571

ABSTRACT:
A method of forming a mesa in a semiconductor device comprises forming a plurality of such devices on a wafer, mechanically cutting relatively wide channels to a predetermined depth in said wafer at positions around individual ones of the devices to partially separate the devices from each other. The mechanical cutting technique defines mesa walls and plain surfaces between individual devices. These channels are then etched to repair scars caused by the cutting technique and, thereafter, the wafer is broken along the center line of the channels to separate the devices from each other.

REFERENCES:
patent: 2911773 (1959-11-01), Gobat
patent: 3081586 (1963-03-01), Gersbach
patent: 3852876 (1974-12-01), Sheldon et al.
patent: 3970819 (1976-07-01), Gates et al.
patent: 3991296 (1976-11-01), Kojima et al.
patent: 4019248 (1977-04-01), Black
patent: 4135291 (1979-01-01), Tursky et al.
patent: 4217689 (1980-08-01), Fujii et al.
patent: 4237601 (1980-12-01), Woolhouse et al.
Garcia, J. R., "Electrical Isolation of Semiconductor Chip Edges", I.B.M. Tech. Discl. Bull., vol. 8, No. 5, Oct. 1965, p. 800-801.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a mesa in a semiconductor device with subseque does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a mesa in a semiconductor device with subseque, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a mesa in a semiconductor device with subseque will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-942868

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.