Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2006-02-21
2006-02-21
Mohamedulla, Saleha R. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C430S313000, C430S323000
Reexamination Certificate
active
07001692
ABSTRACT:
A method of forming a mask comprises forming a mask layer including nitrogen, forming a photoresist pattern on the mask layer and etching the mask layer using a mixes gas including a first gas adapted for etching the mask layer and a second gas for increasing selectivity of the photoresist pattern, thereby forming a hard mask. In this manner, selectivity of the photoresist is improved while a high etching ratio of the nitride layer is maintained when forming a hard mask.
REFERENCES:
patent: 6020269 (2000-02-01), Wang et al.
Hwang Jae-Seung
Kwean Sung-Un
Mills & Onello LLP
Mohamedulla Saleha R.
Samsung Electronics Co,. Ltd.
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