Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1999-01-29
2000-12-12
Bowers, Charles
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
H01L 2164
Patent
active
061598682
ABSTRACT:
A method of manufacturing a semiconductor device characterized by a method of forming a thin insulating film mainly composed of barium strontium titanate, the method having a first step for forming, on a semiconductor substrate, a thin BST film by a CVD method, and a second step for performing annealing at a temperature higher than a temperature at the thin BST films is formed so that crystallinity of the thin BST films is improved, wherein the temperature of the semiconductor substrate is maintained at a temperature higher than 250.degree. C. in a period of time between the first step and the second step in order to prevent a deterioration in a quality of the thin BST film.
REFERENCES:
patent: 5728603 (1998-03-01), Emesh et al.
patent: 5853500 (1998-12-01), Joshi et al.
Eguchi Kazuhiro
Hieda Katsuhiko
Kiyotoshi Masahiro
Bowers Charles
Kabushiki Kaisha Toshiba
Pert Evan
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