Method of forming a dielectric film and semiconductor device inc

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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437241, H01L 21318

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046923446

ABSTRACT:
A method for forming a dielectric film over a semiconductor device is disclosed. The body of semiconductor material is formed and a hydrogen-containing silicon nitride material substantially free of silicon-hydrogen bonds is formed thereover.
Also disclosed is a semiconductor device, including a body of semiconductor material and a dielectric film thereover. The dielectric film is a hydrogen-containing silicon nitride material substantially free of silicon-to-hydrogen bonds.

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Morosanu et al., "Thin Film Preparation by Plasma and LPCVD in a Horizontal Reactor", Vacuum, vol. 31, No. 7, pp. 309-313, Dec. 1981.
Hezel et al., "Plasma Si Nitride . . .", J. Appl. Phys., 52(4), Apr. 1981, pp. 3076-3079.

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