Method of forming a crystalline phase material, electrically con

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438649, 438655, H01L 2144

Patent

active

060907088

ABSTRACT:
A method of forming a crystalline phase material includes providing a stress inducing material on a substrate and, after providing the stress inducing material on the substrate, depositing a crystalline phase material over the substrate in a substantially continuous manner and changing deposition temperature at least once during the depositing, and forming the second crystalline phase of the crystalline phase material. In accordance another aspect, a method is performed by providing a stress inducing material on a substrate and, after providing the stress inducing material on the substrate, forming a crystalline phase material over the substrate in at least two discrete crystalline phase material depositions, a later of the depositions being conducted at a different temperature from an earlier of the depositions and forming the second crystalline phase of the crystalline phase material. In another aspect, a method is performed by forming a refractory metal silicide layer of C54 crystalline phase on a substrate, and depositing refractory metal silicide material onto the C54 refractory metal silicide layer with the C54 crystalline phase being induced into the refractory metal silicide material from the C54 crystalline phase in the refractory metal silicide layer.

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Ilderem, V., et al., "Optimized Deposition Parameters For Low Pressure Chemical Vapor Deposited Titanium Silicide", Massachusetts Institute of Technology, vol. 135, No. 10, pp. 2590-2596 (Feb. 1988).
Nagabushnam, R.V., "Kinetics And Mechanism Of The C49 to C54 Titanium Disilicide Phase Transformation Formation In Nitrogen Ambient", 5 Pages (Nov. 1995).

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