Method of forming a conductive line and a method of forming...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S259000, C438S429000, C438S430000, C438S642000, C438S648000

Reexamination Certificate

active

07491641

ABSTRACT:
This invention includes methods of forming conductive lines, and methods of forming conductive contacts adjacent conductive lines. In one implementation, a method of forming a conductive line includes forming a conductive line within an elongated trench within first insulative material over a semiconductive substrate. The conductive line is laterally spaced from opposing first insulative material sidewall surfaces of the trench. The conductive line includes a second conductive material received over a different first conductive material. The second conductive material is recessed relative to an elevationally outer surface of the first insulative material proximate the trench. A second insulative material different from the first insulative material is formed within the trench over a top surface of the conductive line and within laterally opposing spaces received between the first insulative material and the conductive line. In one implementation, a conductive contact is formed adjacent to and insulated from the conductive line.

REFERENCES:
patent: 4661202 (1987-04-01), Ochii
patent: 5422296 (1995-06-01), Lage
patent: 5573969 (1996-11-01), Kim
patent: 5614765 (1997-03-01), Avanzino et al.
patent: 5920098 (1999-07-01), Liaw
patent: 5970375 (1999-10-01), Gardner et al.
patent: 6008084 (1999-12-01), Sung
patent: 6011712 (2000-01-01), Lee
patent: 6017813 (2000-01-01), Kuo
patent: 6027994 (2000-02-01), Huang et al.
patent: 6071804 (2000-06-01), Gau
patent: 6133116 (2000-10-01), Kim et al.
patent: 6180494 (2001-01-01), Manning
patent: 6258709 (2001-07-01), McDaniel
patent: 6261908 (2001-07-01), Hause et al.
patent: 6271125 (2001-08-01), Yoo et al.
patent: 6287965 (2001-09-01), Kang et al.
patent: 6337274 (2002-01-01), Hu et al.
patent: 6346438 (2002-02-01), Yagishita et al.
patent: 6350679 (2002-02-01), McDaniel et al.
patent: 6365504 (2002-04-01), Chien et al.
patent: 6376380 (2002-04-01), Tang et al.
patent: 6394883 (2002-05-01), Carlson et al.
patent: 6461225 (2002-10-01), Misra et al.
patent: 6489234 (2002-12-01), Itoh
patent: 6498088 (2002-12-01), Trivedi
patent: 6720269 (2004-04-01), Park et al.
patent: 6724054 (2004-04-01), Kang et al.
patent: 6730570 (2004-05-01), Shin et al.
patent: 6867497 (2005-03-01), Trivedi
patent: 6876497 (2005-04-01), Lee et al.
patent: 2001/0003663 (2001-06-01), Huang
patent: 2002/0072224 (2002-06-01), Huang et al.
patent: 2005/0277264 (2005-12-01), Cheng et al.
patent: 2006/0073695 (2006-04-01), Filippi et al.
patent: 0457131 (1991-11-01), None
Wolf et al., Silicon Processing For The VLSI Era, vol. 1: Process Technology, pp. 5 and 6 (Lattice Press 1986).
U.S. Appl. No. 09/976,635, filed Oct. 2001, Trivedi.
U.S. Appl. No. 10/222,305, filed Aug. 2002, Trivedi.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a conductive line and a method of forming... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a conductive line and a method of forming..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a conductive line and a method of forming... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4063028

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.