Method of forming a bond pad structure

Metal working – Method of mechanical manufacture – Electrical device making

Reexamination Certificate

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C029S516000, C029S516000, C029S593000, C029S825000, C029S843000, C029S846000, C029S885000, C204S192380, C204S192250, C257S752000, C257S758000, C430S198000, C430S311000

Reexamination Certificate

active

07146722

ABSTRACT:
A bond pad structure comprising two bond pads, methods of forming the bond pad structure, an integrated circuit die incorporating the bond pad structure, and methods of using the bond pad structure are provided. Each of the bond pads comprise stacked metal layers, at least one lower metal layer and an upper metal layer. When the two pads are connected by a conductive material, they function as a single pad. The lower metal layer of one of the bond pads forms an extension that extends beneath the upper metal layer of the other of the bond pad. The lower metal extension functions to block the etching of a dielectric layer that is put down over the upper metal layers and the underlying substrate, for example, during a passivation etch to form the bond pad opening, to protect the substrate from damage.

REFERENCES:
patent: 4184909 (1980-01-01), Chang et al.
patent: 4621045 (1986-11-01), Goodner
patent: 4721689 (1988-01-01), Chaloux et al.
patent: 5292624 (1994-03-01), Wei
patent: 5384284 (1995-01-01), Doan et al.
patent: 5480834 (1996-01-01), Lake et al.
patent: 5506499 (1996-04-01), Puar
patent: 5706578 (1998-01-01), Hubner
patent: 5721496 (1998-02-01), Farnworth et al.
patent: 5796746 (1998-08-01), Farnworth et al.
patent: 5854513 (1998-12-01), Kim
patent: 5859442 (1999-01-01), Manning
patent: 5869869 (1999-02-01), Hively
patent: 5883435 (1999-03-01), Geffken et al.
patent: 5900643 (1999-05-01), Preslar et al.
patent: 5918107 (1999-06-01), Fogal et al.
patent: 6018462 (2000-01-01), Sakuyama
patent: 6078100 (2000-06-01), Duesman et al.
patent: 6204072 (2001-03-01), Wright et al.
patent: 6240535 (2001-05-01), Farnworth et al.
patent: 6300688 (2001-10-01), Wong
patent: 6420664 (2002-07-01), Muramatsu et al.
patent: 6424028 (2002-07-01), Dickinson
patent: 6455943 (2002-09-01), Sheu et al.
patent: 6465892 (2002-10-01), Suga
patent: 6495917 (2002-12-01), Ellis-Monaghan et al.
patent: 6504252 (2003-01-01), Matsunaga
patent: 6509643 (2003-01-01), Ohtaka et al.
patent: 6597187 (2003-07-01), Eldridge et al.
patent: 6621260 (2003-09-01), Eldridge et al.
patent: 6656828 (2003-12-01), Maitani et al.
patent: 6770906 (2004-08-01), Corbett et al.
patent: 6852999 (2005-02-01), Farnworth et al.
patent: 6952371 (2005-10-01), Koelling et al.
patent: 07312478 (1995-11-01), None

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