Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2004-08-13
2009-06-02
Ghyka, Alexander G (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S644000, C438S682000, C257SE21130, C257SE21160
Reexamination Certificate
active
07541280
ABSTRACT:
A method of forming a micromechanical structure, wherein at least one micromechanical structural layer is provided above a substrate. The micromechanical structural layer is sustained between a lower sacrificial silicon layer and an upper sacrificial silicon layer, wherein a metal silicide layer is formed between the lower and upper sacrificial silicon layers to increase interface adhesion therebetween. The upper sacrificial silicon layer, the metal silicide layer and the lower sacrificial silicon layer are then removed to release the micromechanical structural layer.
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patent: 6551928 (2003-04-01), Wu
Chen Chia-Chiang
Po Ching-Heng
Wang Shen-Ping
Birch & Stewart Kolasch & Birch, LLP
Chang Leonard
Ghyka Alexander G
Taiwan Semiconductor Manufacturing Co. Ltd.
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