Method of filling an aperture in a substrate

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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427 96, 427 97, 428345, G03F 700

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active

061140988

ABSTRACT:
An aperture in an electronic substrate is filled with a filling material without need for a specially built fill mask. A layer of tape or tentable photosensitive dielectric film is applied to one surface of the substrate covering the aperture. An opening is made in the tape or film by directing radiation through the aperture. Fill material is then forced through the opening to substantially fill the aperture. Protruding nubs may be removed to planarize the substrate surfaces.

REFERENCES:
patent: 4032743 (1977-06-01), Erbach et al.
patent: 4434134 (1984-02-01), Darrow
patent: 4881320 (1989-11-01), Kohle et al.
patent: 5277928 (1994-01-01), Seki et al.
patent: 5367143 (1994-11-01), White, Jr.
patent: 5435480 (1995-07-01), Hart et al.
patent: 5536677 (1996-07-01), Hubacher
patent: 5556807 (1996-09-01), Bhattacharyya
patent: 5669970 (1997-09-01), Balog et al.
patent: 5673846 (1997-10-01), Gruber
patent: 5678287 (1997-10-01), Smith et al.
patent: 5822856 (1998-10-01), Bhatt
patent: 5840465 (1998-11-01), Kakinuma

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