Method of fabricating transistor in semiconductor device

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Diffusing a dopant

Reexamination Certificate

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C438S592000, C438S923000, C257SE21438

Reexamination Certificate

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07435669

ABSTRACT:
A method of fabricating a transistor in a semiconductor device. A gate oxide layer and a gate are formed on a semiconductor substrate. An oxide layer and a silicon nitride layer are stacked on the substrate. The stacked oxide and silicon nitride layers are etched back to expose a surface of the substrate. The silicon nitride layer is removed to form a gate sidewall spacer. Impurity ions are implanted into the substrate through the exposed surface of the substrate.

REFERENCES:
patent: 4757026 (1988-07-01), Woo et al.
patent: 5334556 (1994-08-01), Guldi
patent: 5770508 (1998-06-01), Yeh et al.
patent: 6235597 (2001-05-01), Miles
patent: 6635966 (2003-10-01), Kim

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