Method of fabricating storage capacitor in semiconductor...

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Reexamination Certificate

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C438S386000, C438S602000, C438S640000, C438S669000, C438S672000, C438S756000, C438S757000

Reexamination Certificate

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06911372

ABSTRACT:
A storage capacitor has a double cylinder type structure, with a small cylinder in a lower part thereof and a cylindrical lower electrode structure disposed on the cylindrical contact plug. A method of fabricating the storage capacitor includes: forming a contact hole for exposing an activation region of a transistor; depositing a conductive film to form within the contact hole a contact plug of the storage capacitor having a void therein; opening an upper part of the void of the contact plug; and covering a surface of the device with material to form the storage capacitor electrode, to obtain the storage capacitor electrode having a double cylindrical structure.

REFERENCES:
patent: 5811331 (1998-09-01), Ying et al.
patent: 5861671 (1999-01-01), Tsai et al.
Quirk et al., Semiconductor Manufacturing Technology (2001), Prentice Hall, pp. 457-459.

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