Method of fabricating SOI wafer

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

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438152, 438459, H01C 7100

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active

060371986

ABSTRACT:
The present invention is to fabricate SOI wafer whose the silicon layer is very uniform and the impurity concentration is low. The insulating layer, that is, a composite layer of SiO2 and silicon, is grown on oxide substrate by means of a molecular beam epitaxy fabricating method using silicon as an original material in the oxygen atmosphere. The composite layer of the oxide and silicon is grown according to gradual decreasing the pressure of oxygen atmosphere. A top silicon layer of uniform thickness is grown by means of a molecular beam epitaxy fabricating method using only silicon material consecutively on the composite layer.

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Jingbao Liu et al., "Formation of buried oxide in silicon using separation plasma implantation of oxygen", Appl. Phys. Lett. 67 (16), Oct. 16, 1995, 1995 American Institute of Physics, pp. 2361-2363.

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