Method of fabricating semiconductor devices with a passivated su

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438739, 438606, 438167, H01L 2144

Patent

active

057190887

ABSTRACT:
A method of fabricating semiconductor devices with a passivated surface includes providing a contact layer on a substrate so as to define an inter-electrode surface area. A first layer and an insulating layer, which are selectively etchable relative to each other and to the substrate and the contact layer, are deposited on the contact layer and the inter-electrode surface area. The insulating layer and the first layer are individually and selectively etched to define an electrode contact area and to expose the inter-electrode surface area. The exposed inter-electrode surface area is passivated, either subsequent to or during the etching of the first layer. A metal contact is formed in the electrode contact area in abutting engagement with the insulating layer so as to seal the inter-electrode surface area.

REFERENCES:
patent: 5389574 (1995-02-01), Mizunuma
W.C. Simpson, et al. "Soft X-ray photoelectron spectroscopy study of the reaction of XeF.sub.2 with GaAs" J.Vac. Sci. Technol. A 13(3) (May 1 Jun. 1995) pp. 1709-1713.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating semiconductor devices with a passivated su does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating semiconductor devices with a passivated su, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating semiconductor devices with a passivated su will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1783827

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.