Method of fabricating semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438589, 438591, 438167, H01L 21338

Patent

active

058888594

ABSTRACT:
A method of making a semiconductor device includes forming a recess in a compound semiconductor substrate using a patterned insulating film on a surface of the substrate, implanting dopant ions at the bottom of the recess to form a channel region, and depositing a refractory metal film. The refractory metal film is etched, using a resist pattern, to form a gate electrode and additional dopant ions are implanted to form relatively highly doped regions intersecting the channel region. Very highly doped regions are formed my implantation, after removing the insulating film, using the gate electrode and remainder of the resist mask as an implantation mask. After stripping the resist, annealing to activate the implanted ions, and depositing a passivating film on the substrate and gate electrode, source and drain electrodes are formed. The field effect transistor thus produced has a high breakdown voltage, improved reliability, a highly controlled pinch-off voltage, and improved transconductance and operating speed.

REFERENCES:
patent: 4829347 (1989-05-01), Cheng et al.
patent: 5389574 (1995-02-01), Mizunuma
patent: 5436489 (1995-07-01), Murase
patent: 5471073 (1995-11-01), Kohno
patent: 5486710 (1996-01-01), Kitano
Hayama et al., "Emitter Size Effect On Current Gain In Fully Self-Aligned AlGaAs/GaAs HBT's With AlGaAs Surface Passivation Layer", IEEE Electron Device Letters, vol. 11, No. 9, 1990, pp. 388-390 No Month.
Noda et al., "A High-Speed And Highly Uniform Submicrometer-Gate BPLDD GaAs MESFET For GaAs LSI's", IEEE Transactions on Electron Devices, vol. 39, No. 14, 1992, pp. 737-766 No Month.
"Fabrication Technology, Device Parameters, And Equivalent Circuit", Gallium Arsenide by Howes et al., 1985, pp. 370-383 No Month.
Hanyu et al., "Super Low Noise HEMTs With A T-Shaped WSi.sub.x Gate", Electronics Letters, vol. 24, No. 21, 1988, pp. 1327-1328 No Month.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1214261

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.