Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Patent
1996-04-22
1997-04-22
Trinh, Michael
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
438462, 438941, 438637, H01L 21301
Patent
active
056228996
ABSTRACT:
A process has been developed in which photoresist thinning at the edges of silicon chips, resulting from photoresist flowing from semiconductor chips, exhibiting features with raised topographies, to flat scribe regions, has been reduced. The reduction in photoresist flowing has been accomplished by creating a chessboard pattern of raised insulator and metal features, in the scribe line region, thus reducing the differences in topography between the scribe line and chip regions. The areas between the raised mesas, in the scribe line regions, are used for laser or optical endpoint detection of RIE processes.
REFERENCES:
patent: 5017512 (1991-05-01), Takagi
patent: 5132252 (1992-07-01), Shiraiwa et al.
patent: 5136354 (1992-08-01), Morita et al.
patent: 5234868 (1993-08-01), Cote
patent: 5290711 (1994-03-01), Yanagisawa
patent: 5462636 (1995-10-01), Chen et al.
patent: 5472895 (1995-12-01), Park
Chao Ying-Chem
Shen Chin-Heng
Saile George O.
Taiwan Semiconductor Manufacturing Company , Ltd.
Trinh Michael
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