Method of fabricating polysilicon film by excimer laser...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C439S486000, C439S482000, C439S166000

Reexamination Certificate

active

07071083

ABSTRACT:
A method of fabricating a polysilicon film by an excimer laser crystallization process. First, a substrate comprising a first region and a second region is provided. An amorphous silicon layer and a mask layer are formed on the substrate in sequence. Then, a photo-etching process is performed to remove the mask layer in the first region. A heat-retaining capping layer is formed on the mask layer and the amorphous silicon layer. After that, an excimer laser crystallization process is performed so that the amorphous silicon layer in the first region is crystallized into a polysilicon film.

REFERENCES:
patent: 5308998 (1994-05-01), Yamazaki et al.
patent: 5365080 (1994-11-01), Yamazaki et al.
patent: 5581092 (1996-12-01), Takemura
patent: 5648662 (1997-07-01), Zhang et al.
patent: 5693541 (1997-12-01), Yamazaki et al.
patent: 5705413 (1998-01-01), Harkin et al.
patent: 6001714 (1999-12-01), Nakajima et al.
patent: 6118139 (2000-09-01), Yuda
patent: 6197623 (2001-03-01), Joo et al.
patent: 6426245 (2002-07-01), Kawasaki et al.
patent: 60191088 (1985-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating polysilicon film by excimer laser... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating polysilicon film by excimer laser..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating polysilicon film by excimer laser... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3599565

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.