Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2011-03-22
2011-03-22
Chambliss, Alonzo (Department: 2892)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S113000, C438S126000, C438S460000, C257S048000, C257S782000, C257S787000, C257SE23010, C257SE21499, C257SE21505
Reexamination Certificate
active
07910385
ABSTRACT:
Microelectronic devices and methods for manufacturing microelectronic devices are described herein. An embodiment of one such method includes attaching a plurality of singulated microelectronic dies to a removable support member with an active side of the individual dies facing toward the support member, depositing a flowable material onto the dies and a portion of the removable support member such that the flowable material covers a back side of the individual dies and is disposed between adjacent dies, and removing the support member from the active sides of the dies.
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Brooks J. Michael
Jiang Tongbi
Kweon Young Do
Chambliss Alonzo
Micro)n Technology, Inc.
Perkins Coie LLP
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