Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2011-01-25
2011-01-25
Landau, Matthew C (Department: 2813)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S070000, C257S294000, C257SE33068
Reexamination Certificate
active
07875488
ABSTRACT:
A method of fabricating an image sensor according to example embodiments may include forming a photodiode in a photoelectric conversion region of a substrate and forming an etch stop layer on the substrate. The etch stop layer may be patterned to form an inner lens on the photoelectric conversion region and an etch stop layer pattern on a transistor region of the substrate. A metal interconnection structure may be formed on the inner lens and the etch stop layer pattern. Accordingly, the number of additional processes for fabricating an image sensor may be reduced.
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Hong Jong-wook
Oh Tae-seok
Oh Young-Mook
Park Won-Je
Yi Duk-Min
Harness & Dickey & Pierce P.L.C.
Landau Matthew C
Luke Daniel
Samsung Electronics Co,. Ltd.
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