Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate
2011-03-15
2011-03-15
Lindsay, Jr., Walter L (Department: 2812)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
C257SE21090
Reexamination Certificate
active
07906412
ABSTRACT:
A method of fabricating a group III nitride semiconductor single crystal includes preparing a seed substrate which includes group III nitride semiconductor and has a crystal growth face of single index plane, and epitaxially growing the group III nitride semiconductor single crystal on the crystal growth face, wherein the group III nitride semiconductor single crystal is epitaxially grown while being surrounded by a plurality of crystal surfaces including low-index planes spontaneously formed, and the low-index planes have a structure that each of plane indices showing a crystal plane is not more than 3.
REFERENCES:
patent: 6667184 (2003-12-01), Motoki et al.
patent: 2004/0211355 (2004-10-01), Motoki et al.
patent: 2007/0266928 (2007-11-01), Iwata et al.
patent: 2009/0056618 (2009-03-01), Yoshida
patent: 2007-314357 (2007-12-01), None
S. Kubo et al. (2008) “Bulk GaN crystals grown by HVPE”, 2nd International Symposium on Growth of III-Nitrides, Presentation No. I-TU-5.
Hitachi Cable Ltd.
Isaac Stanetta D
Lindsay, Jr. Walter L
McGinn IP Law Group PLLC
LandOfFree
Method of fabricating group III nitride semiconductor single... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of fabricating group III nitride semiconductor single..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating group III nitride semiconductor single... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2713473