Method of fabricating encapsulated semiconductor components...

Semiconductor device manufacturing: process – Semiconductor substrate dicing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S462000

Reexamination Certificate

active

06964915

ABSTRACT:
A semiconductor component includes a thinned semiconductor die having protective polymer layers on up to six surfaces. The component also includes contact bumps on the die embedded in a circuit side polymer layer, and terminal contacts on the contact bumps in a dense area array. A method for fabricating the component includes the steps of providing a substrate containing multiple dice, forming trenches on the substrate proximate to peripheral edges of the dice, and depositing a polymer material into the trenches. In addition, the method includes the steps of planarizing the back side of the substrate to contact the polymer filled trenches, and cutting through the polymer trenches to singulate the components from the substrate. Prior to the singulating step the components can be tested and burned-in while they remain on the substrate.

REFERENCES:
patent: 5138434 (1992-08-01), Wood et al.
patent: 5686317 (1997-11-01), Akram et al.
patent: 5789307 (1998-08-01), Igel et al.
patent: 5851911 (1998-12-01), Farnworth
patent: 5863813 (1999-01-01), Dando
patent: 5888883 (1999-03-01), Sasaki et al.
patent: 5897337 (1999-04-01), Kata et al.
patent: 5904546 (1999-05-01), Wood et al.
patent: 6013948 (2000-01-01), Akram et al.
patent: 6051875 (2000-04-01), Dando
patent: 6060373 (2000-05-01), Saitoh
patent: 6074896 (2000-06-01), Dando
patent: 6080602 (2000-06-01), Tani et al.
patent: 6087845 (2000-07-01), Wood et al.
patent: 6107109 (2000-08-01), Akram et al.
patent: 6107164 (2000-08-01), Ohuchi
patent: 6114240 (2000-09-01), Akram et al.
patent: 6130111 (2000-10-01), Ikuina et al.
patent: 6136137 (2000-10-01), Farnworth et al.
patent: 6150717 (2000-11-01), Wood et al.
patent: 6153448 (2000-11-01), Takahashi et al.
patent: 6169329 (2001-01-01), Farnworth et al.
patent: 6177295 (2001-01-01), De Samber et al.
patent: 6180504 (2001-01-01), Farnworth
patent: 6221751 (2001-04-01), Chen et al.
patent: 6233185 (2001-05-01), Beffa et al.
patent: 6281131 (2001-08-01), Gilton et al.
patent: 6294837 (2001-09-01), Akram et al.
patent: 6313531 (2001-11-01), Geusic et al.
patent: 6326698 (2001-12-01), Akram
patent: 6338980 (2002-01-01), Satoh
patent: 6350664 (2002-02-01), Haji et al.
patent: 6353267 (2002-03-01), Ohuchi et al.
patent: 6524890 (2003-02-01), Ueda et al.
patent: 6534387 (2003-03-01), Shinogi et al.
patent: 6573156 (2003-06-01), Wang et al.
patent: 6579748 (2003-06-01), Okuno et al.
patent: 6607970 (2003-08-01), Wakabayashi
patent: 6649445 (2003-11-01), Qi et al.
patent: 6774659 (2004-08-01), Chiang
patent: 2001/0040117 (2001-11-01), Easton
patent: 2002/0009826 (2002-01-01), Chien
patent: 2002/0097302 (2002-07-01), Nikkel
patent: JP 10-79362 (1998-03-01), None
patent: JP 2000-31185 (2000-01-01), None
U.S. Appl. No. 09/259,142, Farnworth et al.
U.S. Appl. No. 09/652,340, Farnworth et al.
Advanced Coating Parylene Conformal Coating Specialist, advertising material, pp. 1-7, 1998.
Dexter Electronic Materials, Hysol FP4451 Material Properties, spec sheet, pp. 1-2, Aug. 20, 1999.
Dexter Electronic Materials, Hysol FP4450 Material Properties, spec sheet, pp. 1-2, Aug. 20, 1999.
Parylene Coating, advertising for Specialty Coating Systems, p. 1-2, date unknown.
“Wafer size CSP Packagaing by VPES”, Japan Rec Co., Ltd., advertising materials, p. 1-4, 1998.
David Francis & Linda Jardine, “Thin, Wafer-Level Package Is Made Without Damaging Die”,Chip Scale Review, May/Jun. 2002, p. 70.
Jeffrey C. Demmin, “More Wafer Thinning at ICAPS ”, media news analysis, Mar. 13, 2002.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating encapsulated semiconductor components... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating encapsulated semiconductor components..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating encapsulated semiconductor components... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3455341

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.