Method of fabricating contact plug

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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Details

438643, 438644, 438648, 438653, 438654, 438656, 438660, 438663, 438672, H01L 214763, H01L 2144

Patent

active

060431482

ABSTRACT:
A method of fabricating a metal plug. On a semiconductor substrate comprising a MOS device, a dielectric layer, and a via hole penetrating though the dielectric layer, a conformal titanium layer is formed on the dielectric layer and the via hole. A low temperature annealing is formed in a nitrogen environment, so that a surface of the titanium layer is transformed into a first thin titanium nitride layer. A conformal second titanium nitride layer is formed on the first thin titanium nitride layer by using collimator sputtering. A metal layer is formed and etched back on the second titanium nitride layer to form a metal plug.

REFERENCES:
patent: 5723362 (1998-03-01), Inoue et al.
patent: 5893749 (1999-04-01), Matumoto

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