Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1998-04-16
2000-03-28
Niebling, John F.
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438643, 438644, 438648, 438653, 438654, 438656, 438660, 438663, 438672, H01L 214763, H01L 2144
Patent
active
060431482
ABSTRACT:
A method of fabricating a metal plug. On a semiconductor substrate comprising a MOS device, a dielectric layer, and a via hole penetrating though the dielectric layer, a conformal titanium layer is formed on the dielectric layer and the via hole. A low temperature annealing is formed in a nitrogen environment, so that a surface of the titanium layer is transformed into a first thin titanium nitride layer. A conformal second titanium nitride layer is formed on the first thin titanium nitride layer by using collimator sputtering. A metal layer is formed and etched back on the second titanium nitride layer to form a metal plug.
REFERENCES:
patent: 5723362 (1998-03-01), Inoue et al.
patent: 5893749 (1999-04-01), Matumoto
Chen Lih-Juann
Hsieh Win-Yi
Hsieh Yong-Fen
Peng Yuan-Ching
Yang Yu-Ru
Ghyka Alexander G.
Niebling John F.
United Microelectronics Corp.
LandOfFree
Method of fabricating contact plug does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of fabricating contact plug, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating contact plug will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1325733