Method of fabricating a thin film transistor using...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Reexamination Certificate

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C438S149000, C438S289000, C438S514000, C257SE21413, C257SE21414

Reexamination Certificate

active

08071434

ABSTRACT:
Provided is a method of fabricating a thin film transistor including source and drain electrodes, a novel channel layer, a gate insulating layer, and a gate electrode, which are formed on a substrate. The method includes the steps of forming the channel layer using an oxide semiconductor doped with boron; and patterning the channel layer. The channel layer formed is an oxide semiconductor thin film doped with boron. The electrical characteristics and high temperature stability of the thin film transistor are improved remarkably.

REFERENCES:
patent: 5474941 (1995-12-01), Mitani et al.
patent: 2002/0055207 (2002-05-01), Kunii
patent: 2004/0033424 (2004-02-01), Talin et al.
patent: 2005/0017244 (2005-01-01), Hoffman et al.
patent: 2006/0197087 (2006-09-01), Luo et al.
patent: 2000-150900 (2000-05-01), None
patent: 2002-076356 (2002-03-01), None
H. Q. Chiang et al, “High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer”, Applied Physics Letters 86, 013503 (2005).
M. G. McDowell et al, “Combinatorial study of zinc tin oxide thin-film transistors”, Applied Physics Letters 92, 013502 (2008).

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