Method of fabricating a tapered via hole in polyimide

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

156644, 156652, 156653, 1566611, 156668, 437203, 437235, 437947, 437981, H01L 21312

Patent

active

048327883

ABSTRACT:
A method of fabricating a tapered via hole in a polyimide layer of an integrated circuit includes the steps of: disposing a layer of SiO.sub.2 on the polyimide layer and a layer of photoresist on the SiO.sub.2 such that the layers have an opening which exposes a region of the polyimide layer for the via hole; etching the exposed polyimide region partway through the polyimide layer, while simultaneously etching back the photoresist on the sidewalls of the opening to thereby uncover a strip of SiO.sub.2 adjacent to the perimeter of the exposed polyimide region; enlarging the exposed region of the polyimide by etching the uncovered strip of SiO.sub.2 ; and repeating the etching step and enlarging step a predetermined number of times.

REFERENCES:
patent: 4472240 (1984-09-01), Kameyama
patent: 4484979 (1984-11-01), Stocker
patent: 4487652 (1984-12-01), Almgren
patent: 4495220 (1985-01-01), Wolf et al.
patent: 4514252 (1985-04-01), Roland
patent: 4522681 (1985-06-01), Gorowitz et al.
patent: 4560436 (1985-12-01), Bukhman et al.
patent: 4592802 (1986-06-01), Deleonibus et al.

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