Method of fabricating a semiconductor device having metal...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S736000, C257SE21578

Reexamination Certificate

active

07338897

ABSTRACT:
A method of fabricating a semiconductor device includes forming a metal wire on a substrate, forming an interlayer insulating film on the metal wire, forming a resist pattern on the interlayer insulating film, selectively etching the interlayer film to form a trench or via-hole in the interlayer insulating film and reaching the metal wire, and ashing, using a reducing gas, to remove the resist pattern.

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patent: 2002-9050 (2002-01-01), None
patent: 2003-332340 (2003-11-01), None
patent: 2004-103747 (2004-04-01), None
patent: 2004-140151 (2004-05-01), None
Kojima et al., “Mechanism of Cu Oxidation in Ashing Process”, 2001 Dry Process International Symposium V-1, pp. 165-168.

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