Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2004-12-20
2008-03-04
Kebede, Brook (Department: 2823)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S736000, C257SE21578
Reexamination Certificate
active
07338897
ABSTRACT:
A method of fabricating a semiconductor device includes forming a metal wire on a substrate, forming an interlayer insulating film on the metal wire, forming a resist pattern on the interlayer insulating film, selectively etching the interlayer film to form a trench or via-hole in the interlayer insulating film and reaching the metal wire, and ashing, using a reducing gas, to remove the resist pattern.
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Kojima et al., “Mechanism of Cu Oxidation in Ashing Process”, 2001 Dry Process International Symposium V-1, pp. 165-168.
Inukai Kazuaki
Matsushita Atsushi
Kebede Brook
Leydig , Voit & Mayer, Ltd.
Rohm & Co., Ltd.
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