Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate
Reexamination Certificate
2007-12-13
2010-02-02
Landau, Matthew C (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having schottky gate
C438S182000, C438S412000, C438S574000, C438S713000, C257SE21037, C257SE21054, C257SE21450, C257SE21605
Reexamination Certificate
active
07655514
ABSTRACT:
A silicon carbide metal semiconductor field-effect transistor includes a bi-layer silicon carbide buffer for improving electron confinement in the channel region and/or a layer disposed over at least the channel region of the transistor for suppressing surface effects caused by dangling bonds and interface states. Also, a sloped MESA fabrication method which utilizes a dielectric etch mask that protects the MESA top surface during MESA processing and enables formation of sloped MESA sidewalls.
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Kaminsky Edmund B.
Kretchmer James W.
Rowland Larry B.
Tucker Jesse
Zhang An-Ping
Howard IP Law Group PC
Landau Matthew C
Lockheed Martin Corporation
Nicely Joseph C
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