Method of fabricating a MESFET with a sloped MESA structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Reexamination Certificate

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Details

C438S182000, C438S412000, C438S574000, C438S713000, C257SE21037, C257SE21054, C257SE21450, C257SE21605

Reexamination Certificate

active

07655514

ABSTRACT:
A silicon carbide metal semiconductor field-effect transistor includes a bi-layer silicon carbide buffer for improving electron confinement in the channel region and/or a layer disposed over at least the channel region of the transistor for suppressing surface effects caused by dangling bonds and interface states. Also, a sloped MESA fabrication method which utilizes a dielectric etch mask that protects the MESA top surface during MESA processing and enables formation of sloped MESA sidewalls.

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