Method of fabricating a buried contact

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region

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Details

438197, 438233, 438238, 438533, 438647, 438524, 438514, 438527, 438453, 438666, H01L 21425, H01L 21336, H01L 2176

Patent

active

061534986

ABSTRACT:
A method of fabricating a buried contact avoids high resistance at a junction by forming a polysilicon layer in a trench. Thus, the current passage is not cut by the trench. The resistance of the trench junction is decreased.

REFERENCES:
patent: 5525552 (1996-06-01), Huang

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