Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Patent
1998-11-12
2000-11-28
Bowers, Charles
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
438197, 438233, 438238, 438533, 438647, 438524, 438514, 438527, 438453, 438666, H01L 21425, H01L 21336, H01L 2176
Patent
active
061534986
ABSTRACT:
A method of fabricating a buried contact avoids high resistance at a junction by forming a polysilicon layer in a trench. Thus, the current passage is not cut by the trench. The resistance of the trench junction is decreased.
REFERENCES:
patent: 5525552 (1996-06-01), Huang
Bowers Charles
Pham Thanhha
United Microelectronics Corp.
LandOfFree
Method of fabricating a buried contact does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of fabricating a buried contact, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating a buried contact will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1725212