Method of etching silicon carbide

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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1566571, 15665911, 15666111, 216 41, 216 67, 216 79, H01L 2100

Patent

active

055713742

ABSTRACT:
A mask (12) is applied to a silicon carbide substrate (11) in order to etch the substrate (11). The material used for the mask (12) has a Mohs hardness factor greater than 4 in order to prevent sputtering material from the mask (12) onto the substrate (11). An oxygen and sulfur hexafluoride plasma is utilized to perform the etch.

REFERENCES:
patent: 5234537 (1993-08-01), Nagano et al.
patent: 5254215 (1993-10-01), Terakado et al.

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