Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1996-08-08
1999-06-29
Chang, Ceila
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438 39, 438504, 438694, 438913, 438944, 117 97, 117103, 156643, H01L 2118
Patent
active
059168226
ABSTRACT:
In order to facilitate resuming molecular beam epitaxy after etching a substrate or an epitaxial layer, the etching method is implemented in an ultra-high vacuum, and it consists in producing at least two simultaneous chemical beams converging towards the substrate or the layer, the beams being formed of substances, each of which is capable of reacting with elements of different types in the substrate or the layer so as to form volatile compounds. Application in particular to manufacturing photonic and optoelectronic components.
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Tsang et al, In-situ Dry Etching of InP Using Phosphorous Tri-Chloride and Re-Growth inside a Chemical Beam Epitaxial Growth Chamber, Mat. Res. Soc. Symp. Proc., vol. 300 (1993).
Saito et al, "GaAs Surface Cleaning with HC1 Gas and Hydrogen Mixture for Molecular-Beam Epitaxial Growth", Japanese Journal of Applied Physics, vol. 27, No. 4(2), Apr. 1988, Tokyo, Japan, pp. 1702-1703. corresponding to JP-A-58 095694 dated Jun. 07, 1993.
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Gentner Jean-Louis
Goldstein Leon
Jarry Philippe
Alcatel Optronics
Chang Ceila
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