Image analysis – Pattern recognition – Feature extraction
Patent
1994-06-27
1995-12-26
Couso, Yon J.
Image analysis
Pattern recognition
Feature extraction
382266, 382270, G06K 948
Patent
active
054795354
ABSTRACT:
A method of extracting a feature of an image, includes: a first step of performing a logarithmic conversion process for each pixel of an image taken by an electron microscope to carry out non-linear image enhancement; a second step of performing an N(N is a predetermined value) valued process for each pixel of the image underwent the logarithmic conversion process, threshold values for the N valued process being obtained by dividing the whole range of gray levels of the pixels by N, and gray level of the pixel being one of N constant gray level values by the N valued process; a third step of performing a partial differentiatial process in X- and Y-directions for each pixel of the image obtained by the second step, to make "0" the gray levels of pixels within the same area divided by the N valued process and make only the boundary between different areas divided by the N valued process to have a certain gray level; and a fourth step of detecting the boundary and extracting a feature of said image.
REFERENCES:
patent: 4790027 (1988-12-01), Scherl
patent: 5031227 (1991-07-01), Raasch
patent: 5034987 (1991-07-01), Fujimoto et al.
patent: 5073958 (1991-12-01), Imme
patent: 5136659 (1992-08-01), Kaneko et al.
patent: 5210799 (1993-05-01), Rao
Couso Yon J.
Kabushiki Kaisha Toshiba
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