Method of etching

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

156627, 156628, 156642, 156657, 156662, 252 793, 252 794, H01L 21306, B44C 122

Patent

active

052661520

ABSTRACT:
Disclosed is a method of etching comprising preparing an etching solution containing hydrofluoric acid and nitric acid, and etching while adding nitrite ion or a medium for producing nitrite acid ion to the etching solution. As the medium for producing the nitrite ion, silicon with a high impurity concentration, a mixed acid solution containing hydrofluoric acid and nitric acid having been used for dissolving a great amount of silicon, or gaseous nitrogen dioxide may be used. Preferably, the concentration of nitrite ion in the etching solution is detected based on the concentration of NO.sub.x in the gas phase which is in an equilibrium relation to the nitrite ion in the liquid phase of the etching solution, and necessary nitrite ion are added to the etching solution based on the concentration of NO.sub.x.

REFERENCES:
patent: 3592773 (1971-07-01), Muller
patent: 4071397 (1978-01-01), Estreicher et al.
patent: 4681657 (1987-07-01), Hwang et al.
patent: 4971654 (1990-11-01), Schnegg et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of etching does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of etching, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of etching will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2092696

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.