Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-03-18
2008-03-18
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11299757
ABSTRACT:
A method of estimating a wiring complexity degree in a semiconductor integrated circuit with a multi-layered wiring, which has a wiring structure including at least two layers or more, in laying signal wirings, includes a step of predicting a power-supply wiring space used in the semiconductor integrated circuit, a step of dividing the predicted power-supply wiring space onto respective wiring layers, and a step of estimating a complexity degree at a time of laying signal wirings, based on the predicted power-supply wiring space and a wiring specification in respective wiring layers every wiring layer.
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Nagata Eiji
Watanuki Fumihito
Chiang Jack
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Tat Binh
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