Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-01
2007-05-01
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S019000, C703S016000
Reexamination Certificate
active
10994114
ABSTRACT:
A method and computer readable storage medium for estimating total path delay in an integrated circuit design include of receiving as input a number of stage delays and stage delay variations constituting a path in an integrated circuit design. A sum of the stage delays, a worst case sum of the stage delay variations, and a root-sum-square of the stage delay variations are calculated. A a value of a weighting function is calculated as a function of the number of stage delays. A a weighted sum of the worst case sum of the stage delay variations and the root-sum-square of the stage delay variations is calculated from the weighting function. The weighted sum is generated as output to estimate total path delay.
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Kik Phallaka
LSI Logic Corporation
Sandoval Patrick
Whitesell Eric James
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