Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2011-07-26
2011-07-26
Le, Thong Q (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185240, C365S185220, C365S185230, C365S185140
Reexamination Certificate
active
07986565
ABSTRACT:
A method of erasing data in a flash memory device, including erasing data in at least one flash memory cell using a first erase voltage; detecting whether the at least one flash memory cell has a threshold voltage less than a first voltage; programming the at least one flash memory cell by varying the threshold voltage of the at least one flash memory cell using a second voltage that is greater than the first voltage if the detecting step detects the threshold voltage is less than the first voltage; maintaining the threshold voltage of the at least one flash memory cell if the detecting step detects the threshold voltage is greater than the first voltage; and verifying the at least one flash memory cell using a first verification voltage.
REFERENCES:
patent: 6466484 (2002-10-01), Sakakibara et al.
patent: 2008/0298124 (2008-12-01), Wong
patent: 10-2001-0061460 (2001-07-01), None
patent: 10-2001-0061470 (2001-07-01), None
Chun Jin-Young
Jeong Jae-Yong
Harness & Dickey & Pierce P.L.C.
Le Thong Q
Samsung Electronics Co,. Ltd.
LandOfFree
Method of erasing data in flash memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of erasing data in flash memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of erasing data in flash memory device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2665894