Static information storage and retrieval – Systems using particular element – Amorphous
Reexamination Certificate
2011-03-29
2011-03-29
Dinh, Son (Department: 2824)
Static information storage and retrieval
Systems using particular element
Amorphous
C365S185190, C365S185290
Reexamination Certificate
active
07916523
ABSTRACT:
In a first method of erasing a resistive memory device, an electrical potential is applied to the gate of a transistor in series with the resistive memory device, and successive increasing currents are provided through the resistive memory device by means of providing successive increasing electrical potentials across the resistive memory device. In a second method of erasing a resistive memory device, an electrical potential is applied across the resistive memory device, and successive increasing currents are provided through the resistive memory device by means of providing successive increasing electrical potentials to the gate of a transistor in series with the resistive memory device.
REFERENCES:
patent: 7145791 (2006-12-01), Tsushima et al.
patent: 7167390 (2007-01-01), Ishida et al.
patent: 7289351 (2007-10-01), Chen et al.
patent: 7400528 (2008-07-01), Happ et al.
patent: 2006/0104111 (2006-05-01), Tripsas et al.
Reproducibleswitching effect in thin oxide films for memory applications, Beck et al., Applied Physics Letters, vol. 77, No. 1, Jul. 3, 2000, pp. 139-141.
Current-driven insulator-conductortransition and nonvolatile memory in chromium-dopedSrTiO3 single crystals, Watanabe et al., Applied Physics Letters, vol. 78, No. 123 Jun. 4, 2001, pp. 3738-3740.
Hysteretic current-voltagecharncteristics and resistance switching at an epitaxial oxide Schottky junction SrRuO3/SrTi0.99Nb0.01O3,Fuji et al., Applied Physics Letters 86, 012107 (2005), pp. 1-3.
The role of space-charge-limited-currentconduction in evaluation of the electrical properties of thin Cu2O film, Rakhshani, Journal of Applied Physics 69, Feb. 14, 1991, pp. 2365-2369.
Chen An
Haddad Sameer
Kaza Swaroop
Wu Yi-Ching Jean
Dinh Son
Spansion LLC
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