Method of erasing a resistive memory device

Static information storage and retrieval – Systems using particular element – Amorphous

Reexamination Certificate

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C365S185190, C365S185290

Reexamination Certificate

active

07916523

ABSTRACT:
In a first method of erasing a resistive memory device, an electrical potential is applied to the gate of a transistor in series with the resistive memory device, and successive increasing currents are provided through the resistive memory device by means of providing successive increasing electrical potentials across the resistive memory device. In a second method of erasing a resistive memory device, an electrical potential is applied across the resistive memory device, and successive increasing currents are provided through the resistive memory device by means of providing successive increasing electrical potentials to the gate of a transistor in series with the resistive memory device.

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