Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2011-01-11
2011-01-11
Wilczewski, Mary (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S601000, C438S641000, C438S677000, C257SE21479, C257SE21507
Reexamination Certificate
active
07867886
ABSTRACT:
A method, in a complementary metal oxide semiconductor fabrication process, of creating a layered housing containing a micro-electromechanical system device, the method comprising the steps of providing a cavity in at least one layer of the housing, the cavity being accessible through via holes in a layer of insulating material deposited thereon, and the layer of insulating material being covered by a thin film layer of conductive material. The method further comprises the step of hydrophobically treating at least a portion of the inner surface of the cavity. Finally the method comprises the steps of submerging the wafer in an electroplating solution and electroplating a conductive layer onto the thin film layer of conductive material such that the cavity remains free of electroplating solution.
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Search report and written opinion for PCT/US2009/033927 (CK051PCT) dated Jan. 7, 2010.
Smith Charles Gordon
van Kampen Robertus P.
Cavendish Kinetics, Ltd
Patterson & Sheridan LLP
Wilczewski Mary
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