Method of dry cleaning photoresist strips after via contact...

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

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C438S706000, C438S710000, C438S712000, C438S723000, C438S724000, C438S725000, C438S730000, C252S079100, C216S016000, C134S001100

Reexamination Certificate

active

10253384

ABSTRACT:
Semiconductor manufacturing processes that reduce production costs as well as increase throughput by substituting the PR strip and ACT wet cleaning procedure after the via contact etching of a semiconductor with dry cleaning to be performed while removing a photoresist in a conventional PR strip apparatus. In addition, the methods can shorten waiting time and maintain consistency in the process by performing the PR strip and cleaning at the same time in the same chamber. The resultant devices have lower via contact resistance and its deviation, as compared to the conventional PR strip and ACT wet cleaning.

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Chen et al., Method for cleaning via on the semiconductor wafer prevents the metal layer from peeling off and eroding in the cleaning process, Apr. 1, 2001, English Abstract of TW 428245 A, 3 pages.
Notice of Preliminary Rejection from Korean Intellectual Property Office dated Oct. 25, 2004.

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