Method of driving and testing a semiconductor memory device

Details Method of driving and testing a semiconductor memory device Method of driving and testing a semiconductor memory device

2005-09-06

2005-09-06

Auduong, Gene N. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S189011

Reexamination Certificate

active

06940769

ABSTRACT:
A method of driving and testing a semiconductor memory device. First, a plurality of word lines controlled by a driving line is selected by a testing unit, then, a control line coupled to the word lines is enabled by a testing unit. Next, the driving line was enabled. Finally, the driving signal is transferred through the control lines to the word lines.

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patent: 6349065 (2002-02-01), Ooishi
patent: 2004/0042312 (2004-03-01), Kim et al.

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