Method of doping silicon, metal doped silicon, method of...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

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C438S482000, C438S682000, C438S597000

Reexamination Certificate

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06844248

ABSTRACT:
A low temperature process for forming a metal doped silicon layer in which a silicon layer is deposited onto a substrate at low temperatures, with a metal doping layer then deposited upon the silicon layer. This structure is then annealed at low temperatures to form a metal doped semiconductor having greater than about 1×1020dopant atoms per cm3of silicon.

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