Method of determining the endpoint of a planarization process

Abrading – Precision device or process - or with condition responsive... – With indicating

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C451S005000, C451S006000, C451S296000

Reexamination Certificate

active

06932674

ABSTRACT:
A method of determining the endpoint of a planarizing process is disclosed. An endpoint detection signal is selectively sampled from at least one predetermined location within a planarizing region defined on a planarizing web. Planarization is stopped when the endpoint criterion based on the endpoint detection signal is detected.

REFERENCES:
patent: 5851135 (1998-12-01), Sandhu et al.
patent: 6179688 (2001-01-01), Beckage et al.
patent: 6190234 (2001-02-01), Swedek et al.
patent: 6213845 (2001-04-01), Elledge
patent: 6375540 (2002-04-01), Mikhaylich et al.
patent: 6431953 (2002-08-01), Carter et al.
patent: 6447369 (2002-09-01), Moore
patent: 6461964 (2002-10-01), Hofmann et al.
patent: 6464824 (2002-10-01), Hofmann et al.
patent: 6612901 (2003-09-01), Agarwal

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of determining the endpoint of a planarization process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of determining the endpoint of a planarization process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of determining the endpoint of a planarization process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3499311

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.