Method of determining lattice constant, method of evaluating...

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S306000, C250S310000

Reexamination Certificate

active

06844551

ABSTRACT:
The invention provides a method of determining a lattice constant of an arbitrary material such as a polycrystalline material speedily and easily, and a method of evaluating the stress and strain of the material speedily. According to the invention, the lattice constant of a standard sample is varied within a predetermined range and finds the HOLZ line pattern of the standard sample by calculation using an equation (y=f(x, a)=α(a)x+β(a)) and the data of the pattern is accumulated to form a data library. On the other hand, a test sample to be measured is irradiated and scanned with a convergent electron beam. Then, a developing HOLZ line pattern is compared with the HOLZ line pattern in the data library and the most similar HOLZ line pattern is selected. From the data of the lattice constant of the data library having the most similar HOLZ line pattern, the lattice constant of the test sample to be measured is determined. Moreover, the distribution state of the stress and strain of the test sample to be measured can be two-dimensionally mapped by the use of the lattice constant determined in this manner.

REFERENCES:
patent: 6447960 (2002-09-01), Yamashita et al.
patent: 6593153 (2003-07-01), Matsuda et al.
patent: 6750451 (2004-06-01), Koguchi et al.
patent: 20040075055 (2004-04-01), Soeda
patent: 7-167719 (1995-07-01), None
patent: 10-162768 (1998-06-01), None
David B. Williams, et al., “Lattice Parameter, Strain, and Composition Analysis”, Transmission Electron Microscopy, Chp. 21.4, pp. 338 and 340.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of determining lattice constant, method of evaluating... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of determining lattice constant, method of evaluating..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of determining lattice constant, method of evaluating... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3370676

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.