Method of detecting measurement error in measurement system

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C382S100000, C250S306000, C250S252100, C356S401000

Reexamination Certificate

active

07027636

ABSTRACT:
A method of detecting measurement errors in a measurement system includes: a) imaging a pattern, the imaged pattern including a plurality of critical dimension measurement dots, and b) automatically detecting a non-smooth connection of the plurality of the critical dimension measurement dots.

REFERENCES:
patent: 5952132 (1999-09-01), King et al.
patent: 6312963 (2001-11-01), Chou et al.
patent: 6317211 (2001-11-01), Ausschnitt et al.
patent: 6373053 (2002-04-01), Choo et al.
patent: 6449031 (2002-09-01), Grodnensky et al.
patent: 6452677 (2002-09-01), Do et al.
patent: 6573497 (2003-06-01), Rangarajan et al.

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