Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-04-11
2006-04-11
Chawan, Sheela (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S100000, C250S306000, C250S252100, C356S401000
Reexamination Certificate
active
07027636
ABSTRACT:
A method of detecting measurement errors in a measurement system includes: a) imaging a pattern, the imaged pattern including a plurality of critical dimension measurement dots, and b) automatically detecting a non-smooth connection of the plurality of the critical dimension measurement dots.
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Chawan Sheela
Lee & Morse P.C.
Samsung Electronics Co,. Ltd.
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