Method of detecting a distortion on a surface

Details Method of detecting a distortion on a surface Method of detecting a distortion on a surface

2006-02-28

2006-02-28

Lee, HWA (Andrew) (Department: 2877)

Optics: measuring and testing

By light interference

Having polarization

C356S601000, C356S239700

Reexamination Certificate

active

07006233

ABSTRACT:
A method of detecting a distortion on a surface is described. A layer of liquid crystal material is formed on the surface with molecules of the material aligned in planes parallel to the surface. The molecules in each select plane have axes aligned with one another. A phase shift of electromagnetic radiation is detected. The phase shift is due to a distortion in the alignment of the molecules out of a select plane in a region of and due to the distortion on the surface.

REFERENCES:
patent: 6576195 (2003-06-01), Eppes
patent: 6724215 (2004-04-01), Kuroiwa

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