Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-27
2008-08-05
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07409655
ABSTRACT:
A method of designing a semiconductor integrated circuit having a plurality of transistors calculates a leak current corresponding to a sum of a gate leak and a channel leak at each node in the semiconductor integrated circuit, estimates a voltage drop value due to the calculated leak current, determines whether or not the voltage drop value exceeds a threshold value for each node, and inserts a buffer to a node determined that the voltage drop value exceeds the threshold value.
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Kabushiki Kaisha Toshiba
Levin Naum B
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Siek Vuthe
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