Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-16
2008-11-18
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07454734
ABSTRACT:
A method of designing a layout of functional blocks and on-chip capacitors in a semiconductor integrated circuit, includes the steps of, in sequence, (a) placing a functional block, (b) placing an on-chip capacitor in an area which remains vacant after the step (a) has been carried out, (c) overlapping a portion of the functional block having been placed in the step (a) and a portion of the on-chip capacitor having been placed in the step (b) each other, if possible, and (d) placing an on-chip capacitor in a vacant area caused by carrying out the step (c).
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patent: 11-168177 (1999-06-01), None
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Bowers Brandon W
Chiang Jack
Nec Corporation
Young & Thompson
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