Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-01-11
2011-01-11
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07870521
ABSTRACT:
A plurality of sequential nodes in a design file for an electronic device are identified and an effective switching capacitance is determined for a first sequential node of the plurality of sequential nodes based upon statically predicted operation of a first device downstream from the first sequential node. The effective switching capacitance for the first sequential node is stored, and the process is repeated for the other identified sequential nodes in the design file.
REFERENCES:
patent: 6345379 (2002-02-01), Khouja et al.
patent: 7131078 (2006-10-01), Maheshwari et al.
patent: 7475366 (2009-01-01), Kuemerle et al.
patent: 7627836 (2009-12-01), Culp et al.
Advanced Micro Devices , Inc.
Chiang Jack
Tat Binh C
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