Method of depositing a refractory metal on a semiconductor subst

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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29590, 156653, 156657, 156662, 357 54, 357 59, 427 91, 427253, 427307, H01L 21285, H01L 21308, H01L 21314, H01L 2132

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043494080

ABSTRACT:
A method for depositing a refractory on a semiconductor substrate passivated with silicon dioxide and/or oxygen doped polycrystalline silicon is disclosed. The usual undercutting of the oxygen doped polycrystalline silicon or of the silicon substrate at the edge where it meets the oxide is prevented by depositing a layer of phosphorus doped polycrystalline silicon over the passivation material before the metal is deposited.

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Morosanu et al. "Thin Film . . . Reactor" Vacuum, vol. 31, No. 7, (1-19-81), pp. 309-313.

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