Method of creating patterned multilayer films for use in product

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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430317, 430325, 430326, 430328, 156628, G03C 500

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049082981

ABSTRACT:
A method is provided for creating multilayer patterned films wherein at least one layer is an etch-resistant patterned layer, and wherein either positive or negative tone patterns can be obtained.
The etch-resistant patterned layer is obtained by reacting a patterned polymeric film containing reactive functional groups with an organometallic reagent such as a silicon-containing compound. The pattern is subsequently transferred through adjacent polymeric layers using an oxygen plasma or equivalent dry-etch method.

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D. Follett et al., Extended Abstracts, vol. 82-2, Oct. 1982, pp. 321-322, Abstract No. 201.

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